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Ultra-dense co-integration of FeFETs and CMOS logic enabling very-fine grained Logic-in-Memory.

Evelyn T. BreyerHalid MulaosmanovicJens TrommerThomas MeldeStefan DünkelMartin TrentzschSven BeyerThomas MikolajickStefan Slesazeck
Published in: ESSDERC (2019)
Keyphrases
  • fine grained
  • coarse grained
  • random access memory
  • access control
  • high speed
  • delay insensitive
  • logic programming
  • data integration
  • database
  • relational databases
  • modal logic
  • chip design