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Improved deterministic test pattern generation with applications to redundancy identification.

Michael H. SchulzElisabeth Auth
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
  • real time
  • data mining
  • database systems
  • multiscale
  • optimal solution
  • learning environment
  • automatic identification
  • randomized algorithms