Login / Signup

Ultra-low latency NoC testing via pseudo-random test pattern compaction.

Hervé TatenguemAlessandro StranoVineeth GovindJaan RaikDavide Bertozzi
Published in: ISSoC (2012)
Keyphrases
  • low latency
  • pseudorandom
  • high speed
  • uniformly distributed
  • high bandwidth
  • highly efficient
  • random number
  • random numbers
  • virtual machine
  • real time
  • high throughput
  • stream processing
  • secret key