Login / Signup
A doubly-fed induction generator test facility for grid fault ride-through analysis.
David J. Atkinson
Graham Pannell
Wenping Cao
Bashar Zahawi
Tusitha Abeyasekera
Milutin Jovanovic
Published in:
IEEE Instrum. Meas. Mag. (2012)
Keyphrases
</>
image analysis
statistical analysis
information systems
data sets
data structure
data analysis
quantitative analysis