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ConMem: detecting severe concurrency bugs through an effect-oriented approach.

Wei ZhangChong SunShan Lu
Published in: ASPLOS (2010)
Keyphrases
  • database systems
  • computer vision
  • concurrency control
  • information systems
  • source code
  • negative impact
  • data sets
  • artificial intelligence
  • multi agent
  • data management
  • database management systems
  • software systems