Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET.
Taeyoung KimSuhwan LimIlho MyeongSanghyun ParkSuseong NohSeung Min LeeJongho WooHanseung KoYoungji NohMoonkang ChoiKiheun LeeSangwoo HanJongyeon BaekKijoon KimDongjin JungJisung KimJaewoo ParkSeunghyun KimHyoseok KimSijung YooHyun Jae LeeDuk-Hyun ChoeSeung-Geol NamIlyoung YoonChaeho KimKwanzsoo KimKwanzmin ParkBong Jin KuhJinseong HeoWanki KimDaewon HaJaihyuk SongPublished in: IRPS (2024)