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Comprehensive understanding of hot carrier degradation in multiple-fin SOI FinFETs.

Hai JiangLongxiang YinYun LiNuo XuKai ZhaoYandong HeGang DuXiaoyan LiuXing Zhang
Published in: IRPS (2015)
Keyphrases
  • image restoration
  • real time
  • data sets
  • information retrieval
  • database systems
  • social media