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3D Model Registration-Based Batch Wafer-ID Recognition Algorithm.

Fang CaoZengguo TianBaozhu JiangHongshuai ZhangHeng ChenXuguang Zhu
Published in: IEEE Access (2021)
Keyphrases
  • recognition algorithm
  • probabilistic model
  • recognition process
  • computer vision
  • feature extraction
  • high resolution
  • probability distribution
  • image registration