Sign in
Defect Analysis and Prediction by Applying the Multistage Software Reliability Growth Model.
Jieming Chi
Kiyoshi Honda
Hironori Washizaki
Yoshiaki Fukazawa
Kazuki Munakata
Sumie Morita
Tadahiro Uehara
Rieko Yamamoto
Published in:
IWESEP (2017)
Keyphrases
</>
optimization algorithm
multistage
software reliability
growth model
dynamic programming
prediction model
artificial intelligence
image processing
medical images
single stage
expert systems
image analysis
bp neural network