Using Artificial Neural Back-Propagation Network Model to Detect the Outliers in Semiconductor Manufacturing Machines.
Keng-Chieh YangChia-Hui HuangConna YangPei-Yao ChaoPo-Hong ShihPublished in: IEA/AIE (2) (2014)
Keyphrases
- network model
- back propagation
- artificial neural
- semiconductor manufacturing
- feed forward
- artificial neural networks
- neural network
- network architecture
- discrete event simulation
- neural nets
- training algorithm
- feed forward neural networks
- bp neural network
- process control
- hidden layer
- bp algorithm
- multilayer perceptron
- feedforward neural networks
- connection weights
- fuzzy logic
- activation function
- genetic algorithm
- levenberg marquardt
- bp network
- production system
- rbf network
- neural network model
- error back propagation
- recurrent neural networks
- missing data
- weight update
- cascade correlation
- multilayer perceptron neural network
- neuro fuzzy
- radial basis function
- input output
- knowledge base