Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In.

Chen He Yanyao Yu

Published in: ITC (2020)

Keyphrases

high quality
hardware and software
quality measures
higher quality
quality assessment
data mining
knowledge base
multiscale
artificial neural networks
user satisfaction
low quality
integrated circuit
levels of abstraction
automotive industry