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Block-based detection systems for visual artifact location.

Onno EerenbergJeroen KettenisPeter H. N. de With
Published in: IEEE Trans. Consumer Electron. (2013)
Keyphrases
  • detection method
  • detection algorithm
  • high level
  • computer systems
  • knowledge based systems
  • anomaly detection
  • expert systems
  • intelligent systems
  • false positives