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Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods.
Bradley T. Kiddie
William H. Robinson
Daniel B. Limbrick
Published in:
ACM Trans. Design Autom. Electr. Syst. (2015)
Keyphrases
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preprocessing
significant improvement
benchmark datasets
computationally expensive
empirical studies
search methods
machine learning
image processing
image sequences
evolutionary algorithm
computational cost
cross validation