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Effect of Charge Recombination on Amplitude and Time Measurement of Induced Signals in Semiconductor Drift Detectors.

Massimo LazzaroniFabio E. Zocchi
Published in: IEEE Trans. Instrum. Meas. (2007)
Keyphrases
  • instantaneous frequency
  • signal processing
  • building blocks
  • object detection
  • semiconductor manufacturing
  • weak signal detection
  • neural network
  • concept drift
  • semiconductor devices