Defect classification on limited labeled samples with multiscale feature fusion and semi-supervised learning.
Jiahuan LiuFei GuoYun ZhangBinkui HouHuamin ZhouPublished in: Appl. Intell. (2022)
Keyphrases
- semi supervised learning
- labeled samples
- unlabeled samples
- multiscale
- semi supervised
- unlabeled data
- labeled data
- unsupervised learning
- supervised learning
- semi supervised classification
- label propagation
- machine learning
- text categorization
- labeled and unlabeled data
- co training
- image processing
- multiple features
- active learning
- pairwise
- training data
- incremental learning
- discriminative information
- image representation
- reinforcement learning
- learning algorithm