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Direct Cell-Stability Test Techniques for an SRAM Macro with Asymmetric Cell-Bias-Voltage Modulation.

Akira KatayamaTomoaki YabeOsamu HirabayashiYasuhisa TakeyamaKeiichi KushidaTakahiko SasakiNobuaki Otsuka
Published in: ITC (2008)
Keyphrases
  • stem cell
  • microscope images
  • microscopic images
  • neural network
  • power system
  • stability analysis
  • variance reduction