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Double-Node-Upset Self-Recoverable Latch Design for Wide Voltage Range Application.
Yuxin Bai
Chen Xin
Xinjie Zhou
Yanan Yin
Ying Zhang
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2024)
Keyphrases
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wide range
neural network
design methodology
modular design
artificial intelligence
data structure
knowledge based systems
embedded systems
case study
user interface
design process
power consumption
design principles
design decisions
design considerations