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A physical model of electron trapping/detrapping in electrically stressed oxide.
Hongyi Wang
Cong Li
Bingbing Zhang
Shunqiang Xu
Liming Zheng
Jianfei Wu
Published in:
IEICE Electron. Express (2017)
Keyphrases
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computational model
formal model
cost function
theoretical analysis
image sequences
probability distribution
theoretical framework
high level
objective function
probabilistic model
parameter estimation
conceptual model