EEG Artifact Removal by Bayesian Deep Learning & ICA.
Sangmin S. LeeKiwon LeeGuiyeom KangPublished in: EMBC (2020)
Keyphrases
- deep learning
- independent component analysis
- unsupervised feature learning
- machine learning
- signal processing
- unsupervised learning
- bayesian networks
- restricted boltzmann machine
- maximum likelihood
- weakly supervised
- deep architectures
- principal component analysis
- mental models
- blind source separation
- pattern recognition
- feature extraction
- higher order
- face recognition
- image processing