The Embedded Product Testing Using Cleanroom Statistical Method.
Fan LinWenhua ZengGuowu ChenYi JiangPublished in: CSIE (7) (2009)
Keyphrases
- error rate
- experimental evaluation
- computationally efficient
- preprocessing
- statistical methods
- theoretical analysis
- high accuracy
- cost function
- dynamic programming
- high precision
- statistical model
- pairwise
- detection method
- statistical analysis
- fully automatic
- machine learning methods
- medical images
- segmentation algorithm
- support vector machine svm
- genetic algorithm
- support vector machine
- probabilistic model
- k means
- computational complexity
- objective function
- image processing