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Comparison of DEM and BEET linearization techniques for flash analog-to-digital converters using a SFDR metric.

Christopher D. McGuinnessEric J. BalsterFrank A. Scarpino
Published in: ICECS (2010)
Keyphrases
  • circuit design
  • digital elevation
  • mixed signal
  • metric space
  • data conversion
  • metadata
  • analog vlsi
  • delta sigma
  • data sets
  • multiscale