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Comparison of DEM and BEET linearization techniques for flash analog-to-digital converters using a SFDR metric.
Christopher D. McGuinness
Eric J. Balster
Frank A. Scarpino
Published in:
ICECS (2010)
Keyphrases
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circuit design
digital elevation
mixed signal
metric space
data conversion
metadata
analog vlsi
delta sigma
data sets
multiscale