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Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor.
Anne-Marie Jeffery
Lai H. Lee
John Q. Shields
Published in:
IEEE Trans. Instrum. Meas. (1999)
Keyphrases
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high level
theoretical framework
probability distribution
theoretical analysis
computational model
mathematical model
decision trees
probabilistic model
management system
experimental data
sensitivity analysis
formal model
cost function
input data
conceptual model