Integrated circuits' characterization for non-normal data in semiconductor quality analysis.
Ingrid KovacsMarina Dana TopaAndi BuzoGeorg PelzPublished in: ETS (2017)
Keyphrases
- high quality
- data sets
- data quality
- statistical analysis
- data analysis
- raw data
- integrated circuit
- data processing
- database
- spatial data
- data collection
- empirical data
- data sources
- data mining techniques
- image data
- data points
- original data
- input data
- computer systems
- x ray
- end users
- synthetic data
- data acquisition
- xml documents
- image analysis
- data structure
- database systems