Rethinking Fully Convolutional Networks for the Analysis of Photoluminescence Wafer Images.
Maike Lorena SternHans LindbergKlaus Meyer-WegenerPublished in: CoRR (2020)
Keyphrases
- image analysis
- image database
- image data
- ground truth
- input image
- test images
- three dimensional
- object recognition
- image features
- image registration
- original images
- image collections
- image classification
- computer graphics
- image matching
- segmentation algorithm
- region of interest
- lighting conditions
- illumination conditions
- multiple images
- social networks