A "learn 2D, apply 3D" method for 3D deconvolution microscopy.
Ferréol SoulezPublished in: ISBI (2014)
Keyphrases
- neural network
- experimental evaluation
- detection method
- high accuracy
- image analysis
- feature selection
- support vector machine
- dynamic programming
- significant improvement
- probabilistic model
- prior knowledge
- preprocessing
- support vector machine svm
- similarity measure
- segmentation method
- synthetic and real images
- blind deconvolution