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Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure.
Yuichi Hamamura
Kazunori Nemoto
Takaaki Kumazawa
Hisafumi Iwata
Kousuke Okuyama
Shiro Kamohara
Aritoshi Sugimoto
Published in:
DFT (2002)
Keyphrases
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data analysis
image analysis
quantitative analysis
information systems
website
decision trees
image sequences
special case
numerical analysis
database
real world
image processing
statistical analysis
numerical simulations