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Time-Varying Cumulative Damage Recursive Method for Power Semiconductor Devices.
Wei Lai
Hanrui Li
Hui Li
Minyou Chen
Ran Yao
Hongjian Xia
Renkuai Liu
Anbin Liu
Published in:
IEEE Trans. Ind. Electron. (2023)
Keyphrases
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experimental evaluation
high accuracy
synthetic data
probabilistic model
search space
significant improvement
dynamic programming
clustering method
computational complexity
pairwise
cost function
detection method
query processing
support vector machine
sensor networks
low cost