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The impact of IR-based classifier configuration on the performance and the effort of method-level bug localization.

Chakkrit TantithamthavornSurafel Lemma AbebeAhmed E. HassanAkinori IharaKenichi Matsumoto
Published in: Inf. Softw. Technol. (2018)
Keyphrases
  • similarity measure
  • classification algorithm
  • information retrieval
  • support vector machine
  • feature set
  • training samples
  • software engineering
  • clustering method
  • classification method