Login / Signup
Examination of different adder structures concerning di/dt in a 180nm technology.
Andreas Rauchenecker
Timm Ostermann
Published in:
EMC Compo (2015)
Keyphrases
</>
nm technology
power dissipation
power consumption
low power
neural network
data flow
database
real time
genetic algorithm
case study
bayesian networks
image analysis
computational intelligence
pattern matching
complex structures