/4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy.

Yuji Yamagishi Y. Cho

Published in: Microelectron. Reliab. (2018)

Keyphrases

image analysis
high resolution
data sets
computer vision
support vector
user interface
high throughput
piecewise linear
database
real time
image processing
multiscale
pattern recognition
structured light
nonlinear equations