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Research on Electronic Circuit Fault Diagnosis Method Based on SWT and DCNN-ELM.
Yu Zhang
Zhonghua Cheng
Zhenghao Wu
Enzhi Dong
Runze Zhao
Guangyao Lian
Published in:
IEEE Access (2023)
Keyphrases
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extreme learning machine
extreme learning machines
wavelet transform
neural network
transformed images
support vector regression
feed forward neural networks
learning speed
hidden nodes
information retrieval
multiscale
support vector machine
convergence rate
feedforward neural networks
single layer