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A comparison among different setups for measuring on-wafer integrated inductors in RF applications.

Jaime AguileraG. MatiasJoaquín de NoAndrés Garcia-AlonsoRoc Berenguer
Published in: IEEE Trans. Instrum. Meas. (2002)
Keyphrases
  • neural network
  • integrated circuit
  • radio frequency
  • relevance feedback
  • real time
  • real world
  • artificial intelligence
  • three dimensional
  • special case