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Impact of subthreshold hump on bulk-bias dependence of offset voltage variability in weak and moderate inversion regions.

Kiyohiko SakakibaraToshio KumamotoK. Arimoto
Published in: CICC (2012)
Keyphrases
  • low voltage
  • power system
  • field effect transistors
  • input image
  • real time
  • image regions
  • neural network
  • optical flow
  • image reconstruction
  • region of interest
  • parameter space
  • transmission line
  • focal plane