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A comparison between IEM-based surface bistatic scattering models.

Adrian K. FungW. Y. LiuKun-Shan Chen
Published in: IGARSS (2002)
Keyphrases
  • statistical models
  • three dimensional
  • probabilistic model
  • physical models
  • neural network
  • image processing
  • prior knowledge
  • least squares
  • experimental data
  • surface meshes