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Decreasing Test Qualification Time in AMS and RF Systems.

Yves JoannonVincent BeroulleChantal RobachSmail TedjiniJean-Louis Carbonéro
Published in: IEEE Des. Test Comput. (2008)
Keyphrases
  • distributed systems
  • retrieval systems
  • real world
  • systems require
  • data sets
  • database systems
  • expert systems
  • management system
  • computer systems
  • knowledge based systems
  • learning systems