Login / Signup

Design impact of positive temperature dependence on drain current in sub-1-V CMOS VLSIs.

Kouichi KandaKouichi NoseHiroshi KawaguchiTakayasu Sakurai
Published in: IEEE J. Solid State Circuits (2001)
Keyphrases
  • circuit design
  • database
  • design process
  • case study
  • user interface
  • high speed
  • expert systems
  • object oriented
  • positive and negative
  • analog vlsi