Special Issue on Benchmarking Machine Learning Systems and Applications.
Partha Pratim PandePublished in: IEEE Des. Test (2022)
Keyphrases
- machine learning systems
- special issue
- machine learning
- machine learning algorithms
- ai edam
- ecml pkdd
- learning classifier systems
- learning systems
- international journal
- applied intelligence
- special section
- neural network
- prior knowledge
- supervised learning algorithms
- learning algorithm
- data points
- prediction accuracy
- active learning
- expert systems
- data mining