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Effects of Diffraction and Feed Pattern Variation in Shaped Offset Gregorian Reflectors.
Dirk I. L. de Villiers
Robert Lehmensiek
Marianna V. Ivashina
Published in:
IEICE Trans. Commun. (2018)
Keyphrases
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x ray
pattern matching
data mining
data sets
neural network
special case
real time
computer vision
image processing
three dimensional
wide range
pattern recognition
signal processing
infrared
negative effects