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Modeling Quality Reduction of Multichip Module Systems due to Uneven Fault-Coverage and Imperfect Diagnosis.
Nohpill Park
Fabrizio Lombardi
Sungsoo Kim
Published in:
DFT (1996)
Keyphrases
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neural network
intelligent systems
high quality
control system
computer systems
discrete event systems
information systems
management system
image quality
medical diagnosis
model based reasoning
diagnostic systems