An improved analytical series resistance model for on-chip stacked inductors.

Wanghui Zou Xiaofei Chen Xuecheng Zou

Published in: ASICON (2013)

Keyphrases

high level
computational model
similarity measure
probabilistic model
parameter estimation
theoretical framework
statistical model
prediction model
network model
computer vision
cost function
probability distribution
mathematical model
experimental data
sensitivity analysis
neural network model