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Using Dempster-Shafer Theory in MCF Systems to Reject Samples.

Christian ThielFriedhelm SchwenkerGünther Palm
Published in: Multiple Classifier Systems (2005)
Keyphrases
  • dempster shafer theory
  • combination rule
  • neural network
  • pattern recognition
  • belief functions
  • data sets
  • machine learning
  • genetic algorithm
  • image processing
  • probability distribution
  • training samples