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A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals.
Jim Sproch
Published in:
ITC (2004)
Keyphrases
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frequency domain
input output
signal processing
high speed
test set
spectrum analysis
databases
input signals
spectral analysis
file system
main memory
fourier transform
object oriented
wavelet transform
data structure
database systems
genetic algorithm