Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern.
Jounghun ParkGilsang YoonDonghyun GoJungsik KimJeong-Soo LeePublished in: IEEE Access (2021)
Keyphrases
- flash memory
- garbage collection
- solid state
- random access
- main memory
- file system
- buffer management
- embedded systems
- disk drives
- secondary storage
- database systems
- data storage
- b tree
- storage management
- storage devices
- hand held devices
- storage systems
- memory management
- distributed databases
- real time
- small size
- concurrency control
- data structure