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A novel circuit model for multiple Through Silicon Vias (TSVs) in 3D IC.

Yang YiYaping Zhou
Published in: 3DIC (2013)
Keyphrases
  • probabilistic model
  • experimental data
  • high level
  • high speed
  • input data
  • mathematical model
  • prediction model
  • probability distribution
  • low cost
  • markov chain
  • computational model