Login / Signup

Wafer-Scale TaOx Device Variability and Implications for Neuromorphic Computing Applications.

Christopher H. BennettDiana GarlandRobin B. Jacobs-GedrimSapan AgarwalMatthew J. Marinella
Published in: IRPS (2019)
Keyphrases
  • massively parallel
  • intra class
  • semiconductor manufacturing
  • neural network
  • social networks
  • clustering algorithm
  • similarity measure
  • search algorithm