Sign in
Wafer-Scale TaOx Device Variability and Implications for Neuromorphic Computing Applications.
Christopher H. Bennett
Diana Garland
Robin B. Jacobs-Gedrim
Sapan Agarwal
Matthew J. Marinella
Published in:
IRPS (2019)
Keyphrases
</>
massively parallel
intra class
semiconductor manufacturing
neural network
social networks
clustering algorithm
similarity measure
search algorithm