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Three-dimensional deconvolution based on axial-scanning model for structured illumination microscopy.

Hasti ShabaniSimon LabouesseAnne SentenacChrysanthe Preza
Published in: ISBI (2019)
Keyphrases
  • three dimensional
  • probabilistic model
  • computational model
  • high level
  • management system
  • denoising
  • particle filter
  • experimental data