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Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs.

Takayuki MoriJiro IdaShota InoueTakahiro Yoshida
Published in: IEICE Trans. Electron. (2018)
Keyphrases
  • learning curve
  • color images
  • data sets
  • multiresolution
  • human visual system
  • axiomatic characterization