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A New Method to Extract the Silicon Film Thickness of Enhancement Mode Fully Depleted SOIN MOSFETs.
A. S. Nicolett
João A. Martino
E. Simoen
C. Claeys
Marcelo Bellodi
M. A. Pavanello
Published in:
LATW (2000)
Keyphrases
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detection method
pairwise
high accuracy
color images
active learning
data management
segmentation method