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An NMOS LDO With TM-MOS and Dynamic Clamp Technique Handling Up To Sub-10-μs Short-Period Load Transient.

Xin MingJian-Jun KuangXin-Ce GongJie ZhangZhuo WangBo Zhang
Published in: IEEE J. Solid State Circuits (2024)
Keyphrases
  • dynamic environments
  • dynamic response
  • steady state
  • data mining
  • search algorithm
  • data sets
  • real world
  • information retrieval
  • multiresolution
  • long term
  • hidden markov models