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Improving nanoelectronic designs using a statistical approach to identify key parameters in circuit level SEU simulations.
Drew C. Ness
Christian J. Hescott
David J. Lilja
Published in:
NANOARCH (2007)
Keyphrases
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statistical analysis
statistical methods
higher level
data sets
databases
computer vision
website
similarity measure
high speed
information theoretic
design principles
levels of abstraction
statistical inference
electronic circuits